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SSM3K15ACT bảng dữ liệu(PDF) 2 Page - Toshiba Semiconductor |
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SSM3K15ACT bảng dữ liệu(HTML) 2 Page - Toshiba Semiconductor |
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2 / 5 page ![]() SSM3K15ACT 2010-11-29 2 Electrical characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit V (BR) DSS ID = 0.1 mA, VGS = 0 V 30 ⎯ ⎯ Drain-Source breakdown voltage V (BR) DSX ID = 0.1 mA, VGS = -10 V (Note 3) 16 ⎯ ⎯ V Drain cut-off current IDSS VDS = 30 V, VGS = 0 V ⎯ ⎯ 1 μA Gate leakage current IGSS VGS = ±16 V, VDS = 0 V ⎯ ⎯ ±1 μA Gate threshold voltage Vth VDS = 3 V, ID = 0.1 mA 0.8 ⎯ 1.5 V Forward transfer admittance |Yfs| VDS = 3 V, ID = 10 mA (Note 2) 35 ⎯ ⎯ mS ID = 10 mA, VGS = 4 V (Note 2) ⎯ 2.3 3.6 Drain-Source ON-resistance RDS (ON) ID = 10 mA, VGS = 2.5 V (Note 2) ⎯ 3.5 6.0 Ω Input capacitance Ciss ⎯ 13.5 ⎯ Output capacitance Coss ⎯ 8.0 ⎯ Reverse transfer capacitance Crss VDS = 3 V, VGS = 0 V, f = 1 MHz ⎯ 6.5 ⎯ pF Turn-on time ton ⎯ 5.5 ⎯ Switching time Turn-off time toff VDD = 5 V, ID = 10 mA VGS = 0 to 5 V, RG = 50 Ω ⎯ 35 ⎯ ns Drain-source forward voltage VDSF ID = -100 mA, VGS = 0 V (Note 2) ⎯ -0.85 -1.2 V Note 2: Pulse test Note 3: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drain-source breakdown voltage is lowered in this mode. Switching Time Test Circuit Precaution Vth can be expressed as voltage between gate and source when low operating current value is ID = 0.1 mA for this product. For normal switching operation, VGS (on) requires higher voltage than Vth and VGS (off) requires lower voltage than Vth. (Relationship can be established as follows: VGS (off) < Vth < VGS (on) ) Please take this into consideration for using the device. Do not use this device under avalanche mode. It may cause the device to break down. Handling Precaution When handling individual devices (which are not yet mounting on a circuit board), be sure that the environment is protected against electrostatic electricity. Operators should wear anti-static clothing, and containers and other objects that come into direct contact with devices should be made of anti-static materials. Thermal resistance Rth (ch-a) and power dissipation PD vary depending on board material, board area, board thickness and pad area. When using this device, please take heat dissipation into consideration (a) Test circuit VDD = 5 V RG = 50 Ω Duty ≤ 1% VIN: tr, tf < 5 ns Common source Ta = 25°C (b) VIN (c) VOUT 5 V ton toff 0 V VDD VDS (ON) tr tf 10% 90% 90% 10% 0 5 V IN OUT VDD 10 μs |
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