SN74ACT16374Q-EP

16-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOP

WITH 3-STATE OUTPUTS

SCAS679B – MAY 2002 – REVISED JULY 2002

3

POST OFFICE BOX 655303

recommended operating conditions (see Note 3)

MIN

NOM

MAX

UNIT

VCC

Supply voltage (see Note 4)

4.5

5

5.5

V

VIH

High-level input voltage

2

V

VIL

Low-level input voltage

0.8

V

VI

Input voltage

0

VCC

V

VO

Output voltage

0

VCC

V

IOH

High-level output current

–16

mA

IOL

Low-level output current

16

mA

Dt/Dv

Input transition rise or fall rate

0

10

ns/V

TA

Operating free-air temperature

–40

125

°C

NOTES:

3. All unused inputs of the device must be at VCC or GND to ensure proper device operation. Refer to the TI application report,

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

4. All VCC and GND pins must be connected to the proper-voltage power supply.

electrical characteristics over recommended operating free-air temperature range (unless

otherwise noted)

PARAMETER

TEST CONDITIONS

VCC

TA = 25°C

MIN

MAX

UNIT

PARAMETER

TEST CONDITIONS

VCC

MIN

TYP

MAX

MIN

MAX

UNIT

IOH = 50 mA

4.5 V

4.4

4.4

IOH = –50 mA

5.5 V

5.4

5.4

VOH

IOH = 16 mA

4.5 V

3.94

3.7

V

OH

IOH = –16 mA

5.5 V

4.94

4.7

IOH = –24 mA{

5.5 V

3.85

IOL =50 mA

4.5 V

0.1

0.1

IOL = 50 mA

5.5 V

0.1

0.1

VOL

IOL =16mA

4.5 V

0.36

0.5

V

OL

IOL = 16 mA

5.5 V

0.36

0.5

IOL = 24 mA{

5.5 V

0.5

II

VI = VCC or GND

5.5 V

±0.1

±1

mA

IOZ

VO = VCC or GND

5.5 V

±0.5

±10

mA

ICC

VI = VCC or GND,

IO = 0

5.5 V

8

160

mA

DICC‡

One input at 3.4 V,

Other inputs at GND or VCC

5.5 V

0.9

1

mA

Ci

VI = VCC or GND

5 V

4.5

pF

Co

VO = VCC or GND

5 V

12

pF

† Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.

‡ This is the increase in supply current for each input that is at one of the specified TTL-voltage levels rather than 0 V to VCC.