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VCNL4020 bảng dữ liệu(PDF) 9 Page - Vishay Siliconix

tên linh kiện VCNL4020
Giải thích chi tiết về linh kiện  Fully Integrated Proximity and Ambient Light Sensor
PDF  16 Pages
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nhà sản xuất  VISHAY [Vishay Siliconix]
Trang chủ  http://www.vishay.com
Logo VISHAY - Vishay Siliconix

VCNL4020 bảng dữ liệu(HTML) 9 Page - Vishay Siliconix

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VCNL4020
www.vishay.com
Vishay Semiconductors
Rev. 1.1, 20-Jul-12
9
Document Number: 83476
For technical questions, contact: sensorstechsupport@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Register #7 and #8 Proximity Measurement Result Register
Register address = 87h and 88h. These registers are the result registers for proximity measurement readings.
The result is a 16 bit value. The high byte is stored in register #7 and the low byte in register #8.
Register #9 Interrupt Control Register
Register address = 89h.
TABLE 8 - PROXIMITY RESULT REGISTER #7
Bit 7Bit 6
Bit 5Bit 4
Bit 3Bit 2Bit 1Bit 0
Description
Read only bits. High byte (15:8) of proximity measurement result
TABLE 9 - PROXIMITY RESULT REGISTER #8
Bit 7Bit 6
Bit 5Bit 4
Bit 3Bit 2Bit 1Bit 0
Description
Read only bits. Low byte (7:0) of proximity measurement result
TABLE 10 - INTERRUPT CONTROL REGISTER #9
Bit 7Bit 6
Bit 5Bit 4
Bit 3Bit 2Bit 1Bit 0
Int count exceed
n/a
INT_PROX_
ready_EN
INT_ALS_
ready_EN
INT_THRES_EN
INT_THRES_
SEL
Description
Int count exceed
R/W bits. These bits contain the number of consecutive measurements needed above/below the
threshold
000 - 1 count = DEFAULT
001 - 2 count
010 - 4 count
011 - 8 count
100 -16 count
101 - 32 count
110 - 64 count
111 - 128 count
INT_PROX_ready_EN
R/W bit. Enables interrupt generation at proximity data ready
INT_ALS_ ready_EN
R/W bit. Enables interrupt generation at ambient data ready
INT_THRES_EN
R/W bit. Enables interrupt generation when high or low threshold is exceeded
INT_THRES_SEL
R/W bit. If 0: thresholds are applied to proximity measurements
If 1: thresholds are applied to als measurements



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