TS2PCIE412RUAR datasheet(9/17 Pages) TI1

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(see Note A)

TEST CIRCUIT

2 ×

Open

GND

VOH

VOL

VOLTAGE WAVEFORMS

OUTPUT SKEW (tsk(o))

Data Out at

YB1 or YB2

50 Ω

VG1

VDD

VSEL

VDD

VDD/2

DUT

50 Ω

VG2

50 Ω

TEST

1.5 V to 2 V

VDD

tsk(p)

tsk(o)

1.5 V to 2 V

Open

200 Ω

or GND

10 pF

Input Generator

(VOH + VOL)/2

VOH

VOL

Data Out at

XB1 or XB2

(VOH + VOL)/2

Data In at

Ax or Ay

tPLHx

tPHLx

tsk(o)

tPLHy

tPHLy

tsk(o) = tPLHy - t PLHx or tPHLy - t PHLx

VOH

VOL

VOLTAGE WAVEFORMS

PULSE SKEW [tsk(p)]

Output

(VOH + VOL)/2

Input

VDD/2

tPLH

tPHL

tsk(p) = tPHL - t PLH

VDD

TS2PCIE412

www.ti.com

SCDS269C – MARCH 2009 – REVISED APRIL 2010

PARAMETER MEASUREMENT INFORMATION

(Skew)

CL includes probe and jig capacitance.

Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output

control. Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the

output control.

All input pulses are supplied by generators having the following characteristics: PRR

≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5

ns, tf ≤2.5 ns.

The outputs are measured one at a time, with one transition per measurement.

Figure 7. Test Circuit and Voltage Waveforms

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