TPS53313

SLUSAS8

– DECEMBER 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERABLE

OUTPUT

PACKAGE

PINS

MINIMUM QUANTITY

ECO PLAN

DEVICE NUMBER

SUPPLY

TPS53313RGER

24

Tape and reel

3000

Plastic QFN

Green (RoHS and no

–40°C to 85°C

(RGE)

Pb/Br)

TPS53313RGET

24

Mini reel

250

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the TI

website at www.ti.com.

(2)

Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at

www.ti.com/sc/package

ABSOLUTE MAXIMUM RATINGS

(1) (2) (3)

Over operating free air-temperature range (unless otherwise noted)

VALUE

UNIT

MIN

MAX

VIN

–0.3

20.0

VBST

–0.3

27.0

VBST to SW

–0.3

7.0

DC

–2

20

Input voltage range

SW (bidirectional)

V

transient

< 20 ns

–3

20

–0.3

17.0

EN

–0.3

FB, MODE/SS

–0.3

3.6

COMP, RT/SYNC, BP3

–0.3

3.6

Output voltage range

BP7

–0.3

7.0

V

PGD

–0.3

17.0

Output Current

6

A

Ground Pins

GND

–0.3

0.3

V

Human Body Model (HBM)

2000

Electrostatic Discharge

V

Charged Device Model (CDM)

500

–55

150

°C

–40

150

°C

Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds

300

C

(1)

Stresses beyond those listed under

"absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any other conditions beyond those indicated under

"recommended operating

conditions

" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values are with respect to the network ground terminal unless otherwise noted.

(3)

Voltage values are with respect to the corresponding LL terminal.

2

Copyright

© 2011, Texas Instruments Incorporated