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VSP01M02 bảng dữ liệu(PDF) 39 Page - Texas Instruments

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VSP01M02 bảng dữ liệu(HTML) 39 Page - Texas Instruments

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Monitor Signal
TGSection
High-Speed
SignalGenerator
015h-018h
SHP
SHD
AFESection
Delay
Controller
003h[1:0]
Sampling
Circuit
3-nsDelay
Signal
Selector
TPP
TPD
HIGH-SPEED PULSE ADJUSTMENT
VSP01M01
VSP01M02
www.ti.com .................................................................................................................................................................................................. SBES016 – MARCH 2009
The test pin (TPP, TPD) is set up by address 001h, data bit [3] = 1, as shown in Table 27. Table 28 describes
TPP and TPD.
Table 27. Monitor Pin Enable Register(1)
PARAMETER
REGISTER ADDRESS
VALUE
Monitor pin
001h[3]
1 = Enable
(1)
Refer to the Configuration Register section for details.
Table 28. Test Pin Output Select
REGISTER 0B5h[3:0]
TPP
TPD
1000b (8)
SHP
SHD
1001b (9)
CLPOB
CLPDM
1010b (10)
PBLK
HDIV
1011b (11)
HBLK
—
SHP and SHD are monitored at the TG section output, as shown in Figure 30. The actual sampling point is
delayed from the monitor point. The delay time is shown in Figure 30. The actual sampling point delay = delay
controller value (003h[1:0] = 0 ns-6 ns) + sampling delay (3 ns).
Figure 30. SHP/SHD Monitor Out
The high-speed pulse can be adjusted in steps of one pixel clock cycle per 100. The assignment register for
each pulse is shown in Table 29. The rising edge of the RG pulse as a reference.
Table 29. High-Speed Pulse Adjustment Register
REGISTER ADDRESS
CONTROL ITEM
TERMINAL NAME
FALLING
RISING
DELAY
RG
RG
014h[4:0]
—
G1Ah
G1h
G1Bh
011h[4:0]
010h[4:0]
HL
—
G2Ah
G2h
012h[4:0]
013h[4:0]
G2Bh
SHP
SHP
015h[4:0]
016h[4:0]
SHD
SHD
017h[4:0]
018h[4:0]
003h[1:0]
019h[5:0]
ADCCK
ADCCK
—
—
019h[6]
Data out
B0-B15
—
—
002h[1:0]
Copyright © 2009, Texas Instruments Incorporated
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