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SPX431LAS bảng dữ liệu(PDF) 2 Page - Sipex Corporation |
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SPX431LAS bảng dữ liệu(HTML) 2 Page - Sipex Corporation |
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2 / 8 page ![]() Rev. 10/30/00 SPX431L ABSOLUTE MAXIMUM RATINGS Parameter Symbol Rating Units Cathode-Anode Reverse Breakdown VKA 30 V Anode-Cathode Forward Current IAK 1 A Operating Cathode Current IKA 150 mA Reference Input Current IREF 10 mA Continuous Power Dissipation at 25 °C TO-92 SOT-23 SOIC-8 SOT-89 PD 775 200 750 1000 mW mW mW mW Junction Temperature TJ 150 °C Storage Temperature TSTG -65 to +150 °C Lead Temperature (Soldering 10 sec.) TL 300 °C Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. RECOMMENDED CONDITIONS TYPICAL THERMAL RESISTANCE Parameter Symbol Rating Unit Package Type θθθθJA θθθθJC Typical Derating Cathode Voltage VKA VREF to 20 V TO-92 160 °C/W 80 °C/W 6.3 mW/ °C Cathode Current IK 10 mA SOT-23 575 °C/W 150°C/W 1.7 mW/ °C SOIC-8 175 °C/W 45 °C/W 5.7 mW/ °C SOT-89 110 °C/W 8 °C/W 9.1 mW/ °C ELECTRICAL CHARACTERISTICS at 25°C IK @ 10mA VK=VREF , unless otherwise specified. Parameter Symbol Test Conditions SPX431LA SPX431L SPX431LC Unit Min Typ Max Min Typ Max Min Typ Max Reference Voltage VREF TA = 25 °C TC = 1 2.490 2.503 2.515 2.470 2.495 2.520 2.445 2.495 2.545 V Ratio of Change in VREF to Cathode Voltage ∆ VREF ∆VK VREF to 10V 10V to 20V TC = 2 -2.7 -2 -1.0 -0.4 0.3 -2.7 -2 -1.0 -0.4 0.3 -2.7 -2 -1.0 -0.4 0.3 mV/V Reference Input Current IREF TC = 2 0.7 4 0.7 4 0.7 4 µA IREF Temp Deviation ∆IREF Over Temp. TC = 2 0.4 1.2 0.4 1.2 0.4 1.2 µA Min IK for Regulation IK(MIN) TC = 1 0.4 1 0.4 1 0.4 1 mA Off State Leakage IK(OFF) VREF = 0V, VKA = 20V TC = 3 0.04 1 0.04 1 0.04 1 µA Dynamic Output Impedance ZKA TC = 1 0.15 0.5 0.15 0.5 0.15 0.5 Ω TC = Test Circuit |
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