UCD3138 datasheet(16/68 Pages) TI1

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UCD3138

SLUSAP2 A – MARCH 2012 – REVISED MARCH 2012

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ELECTRICAL CHARACTERISTICS (continued)

V33A = V33D = V33DIO = 3.3V; 1

μF from VREG to DGND, TJ = –40°C to 125°C (unless otherwise noted)

PARAMETER

TEST CONDITION

MIN

TYP

MAX

UNIT

ERROR ADC INPUTS EAP, EAN

EAP-AGND

–0.15

1.998

EAP-EAN

-0.256

1.848

Error range

AFE = 0

–256

248

AFE = 3

0.95

1.20

AFE = 2

1.90

2.30

EAP-EAN Error voltage digital resolution

AFE = 1

3.72

4.45

AFE = 0

7.3

9.10

REA

Input impedance

AGND reference

0.5

Ω

IOFFSET

Input offset current

–5

μA

Input voltage = 0 V at AFE = 0

–2

LSB

Input voltage = 0 V at AFE = 1

-2.5

2.5

LSB

EADC Offset

Input voltage = 0 V at AFE = 2

-3

LSB

Input voltage = 0 V at AFE = 3

-4

LSB

Sample Rate

MHz

Analog Frond End Amplifier Bandwidth

100

MHz

Gain

V/V

Minimum output voltage

100

EADC DAC

DAC range

1.6

VREF DAC reference resolution

10 bit, No dithering enabled

1.56

VREF DAC reference resolution

With 4 bit dithering enabled

97.6

μV

INL

–3.0

3.0

LSB

DNL

Does not include MSB transition

–2.1

1.6

LSB

DNL at MSB transition

-1.4

LSB

DAC reference voltage

1.58

1.61

Settling Time

From 10% to 90%

250

ADC12

IBIAS

Bias current for PMBus address pins

9.5

10.5

μA

Measurement range for voltage monitoring

2.5

Internal ADC reference voltage

–40°C to 125°C

2.475

2.500

2.525

25°C to –40°C

-0.4

Internal ADC reference from 25°C

25°C to 85°C

-1.8

reference voltage(1)

25°C to 125°C

-4.2

ADC12 INL integral nonlinearity(1)

+/-2.5

LSB

ADC12 DNL differential nonlinearity(1)

-0.7/+2.5

LSB

ADC_SAMPLINGSEL = 6 for all ADC12

data, 25 °C to 125 °C

ADC Zero Scale Error

-4

ADC Full Scale Error

-35

Input bias

2.5 V applied to pin

400

Input leakage resistance

Ω

Input Capacitance

ADC single sample conversion time

3.9

μs

(1)

As designed and characterized. Not 100% tested in production.

Electrical Specifications

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