TLE5011 datasheet(19/45 Pages) INFINEON

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TLE5011

Specification

Final Data Sheet

V2.0, 2011-03

3.5

Calibration

GMR Values

The end-of-line calibration can be accomplished using following sequence:

1. Turn magnetic field 360° left and measure X and Y values

2. Calculate amplitude, offset, phase correction values of left turn

3. Turn further 90° left and 90° back right without measurement

4. Turn magnetic field 360° right and measure X and Y values

5. Calculate amplitude, offset, phase correction values of right turn

6. Calculate mean values of amplitude, offset, phase correction values

The conditions are specified in Table 9.

The values obtained from this sequence must be stored in a non-volatile memory. They are used for the correction

of the read-out X and Y values before the angular calculation.

The resulting angular deviation is calculated using the parameters determined above.

Temperature Measurement

The signal amplitude T

25 of the temperature measurement path at the calibration conditions must be measured

and stored.

Calibration Conditions

All errors are related to calibration performed by Infineon under the following conditions:

3.6

Angle Calculation

3.6.1

Components of the Output Signals

The X and Y signals at the output can be described by the following equations:

AX : Amplitude of X (= cos) signal

AY : Amplitude of Y (= sin) signal

OX : Offset of X (= cos) signal

OY : Offset of Y (= sin) signal

X : Phase error of X (= cos) signal

Y : Phase error of Y (= sin) signal

3.6.2

GMR Error Compensation

Temperature-dependent Offset Value

To increase the accuracy, the temperature-dependent offset drift can be compensated. The temperature of the

chip must be read out. The offset values O

X and OY can be described by the following equations.

Table 9

GMR test calibration conditions at IFX

Parameter

Symbol

Limit Values

Unit

Notes

min.

typ.

max.

Flux density

BCAL

-30

BZ =0mT

Temperature

TCAL

-25

°C

αϕ

()

cos

αϕ

()

sin

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