SST25VF032B datasheet(23/31 Pages) MICROCHIP

23 / 31 page

S71327-04-000

02/11

32 Mbit SPI Serial Flash

SST25VF032B

Data Sheet

A Microchip Technology Company

Table 11:Recommended System Power-up Timings

Symbol

Parameter

Minimum

Units

TPU-READ1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

VDD Min to Read Operation

100

µs

TPU-WRITE1

VDD Min to Write Operation

100

µs

T11.0 1327

Table 12:Capacitance (TA = 25°C,f=1 Mhz, other pins open)

Parameter

Description

Test Condition

Maximum

COUT1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

Output Pin Capacitance

VOUT =0V

12pF

CIN1

Input Capacitance

VIN =0V

6 pF

T12.0 1327

Table 13:Reliability Characteristics

Symbol

Parameter

Minimum Specification

Units

Test Method

NEND1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

Endurance

10,000

Cycles

JEDEC Standard A117

TDR1

Data Retention

100

Years

JEDEC Standard A103

ILTH1

Latch Up

100 + IDD

JEDEC Standard 78

T13.0 1327

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