74LVC2G66GD datasheet(15/26 Pages) NXP

tên linh kiện	74LVC2G66GD

Giải thích chi tiết về linh kiện	Bilateral switch

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74LVC2G66

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Product data sheet

Rev. 5 — 16 June 2010

15 of 26

NXP Semiconductors

74LVC2G66

Bilateral switch

11.3 Test circuits

Test conditions:

VCC = 1.65 V: Vi = 1.4 V (p-p).

VCC = 2.3 V: Vi = 2 V (p-p).

VCC = 3 V: Vi = 2.5 V (p-p).

VCC = 4.5 V: Vi = 4 V (p-p).

Fig 20. Test circuit for measuring total harmonic distortion

001aag492

VIH

VCC

0.5VCC

nZ/nY

nY/nZ

600

μF

Adjust fi voltage to obtain 0 dBm level at output. Increase fi frequency until dB meter reads −3dB.

Fig 21. Test circuit for measuring the frequency response when switch is in ON-state

001aag491

VIH

VCC

0.5VCC

nZ/nY

nY/nZ

0.1

μF

Adjust fi voltage to obtain 0 dBm level at input.

Fig 22. Test circuit for measuring isolation (OFF-state)

001aag493

VIL

VCC

0.5VCC

nZ/nY

nY/nZ

0.5VCC

0.1

μF

CL dB

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