sames

SA9401

12

Finally the system designer should calculate the PCM sample value for each of the 240

samples in the block. The PCM values used may of course be calculated according to

either A or µ-law and adjusted to suit the required amplitude.

Up to 16 Tone Blocks may be defined each with a maximum of 511 samples. Tone

Blocks are stored in the EPROM starting at address b * 0200H where b is the number of

the block from 0 to 15 (decimal).

APPLICATION INFORMATION

To simplify the translation of Tone Plan requirements to EPROM data SAMES offer a

Support Software pack. This elegant package will guide the designer through the defi-

nition of Tone Plans and translate the requirements into a hex source file ready for most

commonly used PROM programmers. For more details contact your nearest SAMES

representative.

AC PARAMETERS

T

V

AC PARAMETERS

SYM

MIN

TYP

MAX UNITS

Propagation delay of outputs synchronous to

Pd

8M

020

40

ns

CLKIN (i.e. 2MCLK, CLKDIV2, and

WD_INT) relative to CLKIN rising clock edge

Propagation delay of outputs synchronous

Pd

2M

020

40

ns

to 2MCLK (i.e. INTRFRQ, 8KFS, PCMFSC,

INTRCAD, PCM_OUT, A0..A13

Delay to float of PCM_OUT AFTER LAST BIT

Pf

po

030

60

ns

OF TIME-SLOT OUTPUT

Delay to float of WD_INT after going inactive

Pf

WD

030

60

ns

D0..D7 setup to 2MCLK rising edge

Sd

D

100

ns

D0..D7 hold after 2MCLK rising edge

Hd

D

0ns

Absolute Maximum Ratings*

Parameters

Symbol

Min

Max

Unit

Supply Voltage

V

DD

-0.3

7.0

V

Voltage on any I/O pin

V

I

/V

0

-0.3

V

DD

+0.3

V

Current on any I/O pin

I

-10

+10

mA

Storage Temperature

T

SIG

-55

+125

°C

Package Power Dissipation

P

D

1000

m W

* Stress above those listed under "Absolute Maximum Ratings" may cause permanent damage

to the device. This a stress rating only. Functional operation of the device at these or any other

condition above those inidcated in the operational sections of this specification, is not implied.

Exposure to Absolute Maximum Ratings for extended periods may effect device reliability.