BAS28

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Product data sheet

Rev. 3 — 22 July 2010

6 of 12

NXP Semiconductors

BAS28

High-speed double diode

8.

Test information

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

Fig 6.

Reverse recovery time test circuit and waveforms

Fig 7.

Forward recovery voltage test circuit and waveforms

trr

(1)

t

output signal

t

10 %

90 %

input signal

D.U.T.

SAMPLING

OSCILLOSCOPE

mga881

t

10 %

90 %

I

input signal

I

OSCILLOSCOPE

1 k

Ω

450

Ω

D.U.T.

mga882

VFR

t

output signal

V