CC8520

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SWRS091A – MARCH 2010

3

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled

with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may

be more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

PARAMETER

TEST CONDITIONS

Min

Max

Unit

Supply voltage

All supply pins must have the same voltage

–0.3

3.9

V

Voltage on any digital pin

–0.3

min(VDD +

0.3, 3.9)

V

Input RF level

10

dBm

Storage temperature range

-40

85

°C

Reflow soldering temperature

According to IPC/JEDEC J-STD-020

260

°C

All pads, according to human-body model

(HBM), JEDEC STD 22, method A114

2000

V

ESD

(2)

According to charged-device model (CDM),

JEDEC STD 22, method C101E

400

V

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

CAUTION: ESD sensitive device. Precaution should be used when handing the device in order to prevent permanent damage.

RECOMMENDED OPERATING CONDITIONS

PARAMETER

TEST CONDITIONS

Min

Max

Unit

-40

+85

°C

Operating supply voltage

2.0

3.6

V