CAT28C17API-20T datasheet(4/12 Pages) ONSEMI

4 / 12 page

CAT28C17A

http://onsemi.com

Table 4. RELIABILITY CHARACTERISTICS (Note 4)

Symbol

Parameter

Test Method

Min

Max

Units

NEND

Endurance

MIL−STD−883, Test Method 1033

10,000

Cycles/Byte

TDR

Data Retention

MIL−STD−883, Test Method 1008

Years

VZAP

ESD Susceptibility

MIL−STD−883, Test Method 3015

2,000

ILTH (Note 5)

Latch−Up

JEDEC Standard 17

100

4. This parameter is tested initially and after a design or process change that affects the parameter.

5. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VCC + 1 V.

Table 5. D.C. OPERATING CHARACTERISTICS (VCC = 5 V ±10%, unless otherwise specified.)

Symbol

Parameter

Test Conditions

Limits

Units

Min

Typ

Max

ICC

VCC Current (Operating, TTL)

CE = OE = VIL,

f = 1/tRC min, All I/O’s Open

ICCC (Note 6)

VCC Current (Operating, CMOS)

CE = OE = VILC,

f = 1/tRC min, All I/O’s Open

ISB

VCC Current (Standby, TTL)

CE = VIH, All I/O’s Open

ISBC (Note 7)

VCC Current (Standby, CMOS)

CE = VIHC, All I/O’s Open

100

ILI

Input Leakage Current

VIN = GND to VCC

−10

ILO

Output Leakage Current

VOUT = GND to VCC,

CE = VIH

−10

VIH (Note 7)

High Level Input Voltage

VCC + 0.3

VIL (Note 6)

Low Level Input Voltage

−0.3

0.8

VOH

High Level Output Voltage

IOH = −400 mA

2.4

VOL

Low Level Output Voltage

IOL = 2.1 mA

0.4

VWI

Write Inhibit Voltage

3.0

6. VILC = −0.3 V to +0.3 V

7. VIHC = VCC −0.3 V to VCC + 0.3 V

Table 6. A.C. CHARACTERISTICS, READ CYCLE (VCC = 5 V ±10%, unless otherwise specified.)

Symbol

Parameter

28C17A−20

Units

Min

Max

tRC

Read Cycle Time

200

tCE

CE Access Time

200

tAA

Address Access Time

200

tOE

OE Access Time

tLZ (Note 8)

CE Low to Active Output

tOLZ (Note 8)

OE Low to Active Output

tHZ (Notes 8, 9)

CE High to High−Z Output

tOHZ (Notes 8, 9)

OE High to High−Z Output

tOH (Note 8)

Output Hold from Address Change

8. This parameter is tested initially and after a design or process change that affects the parameter.

9. Output floating (High−Z) is defined as the state when the external data line is no longer driven by the output buffer.

CAT28C17API-20T bảng dữ liệu(PDF) 4 Page - ON Semiconductor

CAT28C17API-20T bảng dữ liệu(HTML) 4 Page - ON Semiconductor

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12

bảng dữ liệu tải về

Link URL