Serial

Interface

TimeGainBlock

CLKINP

CLKINM

PLL

BitClock

FrameClock

FCLKP

FCLKM

DCLKP

DCLKM

AVDD3

AVDD18

DVDD18

f

CLKIN

6

f

ADC1

Serializer

LVDS

AAF

IN1

D1P

D1M

Control

Memory

ADC2

Serializer

AAF

IN2

D2P

D2M

ADC3

Serializer

AAF

IN3

D3P

D3M

·

·

·

·

·

·

·

·

·

·

·

·

ADC8

Serializer

AAF

IN8

D8P

D8M

B0328-01

VCM

AVSS

DVSS

AFE5801

SLOS591D – SEPTEMBER 2008 – REVISED MAY 2010

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

BLOCK DIAGRAM

2

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