X22C12

4

POWER-UP TIMING

Symbol

Parameter

Max.

Units

Power-up to Read Operation

100

µs

Power-up to Write or Store Operation

5

ms

3817 PGM T07

MODE SELECTION

CE

WE

RECALL

STORE

I/O

Mode

H

X

H

H

Output High Z

L

H

H

H

Output Data

Read RAM

L

L

H

H

Input Data High

Write “1” RAM

L

L

H

H

Input Data Low

Write “0” RAM

X

H

L

H

Output High Z

Array Recall

H

X

L

H

Output High Z

Array Recall

X

H

H

L

Output High Z

H

X

H

L

Output High Z

3817 PGM T05.1

ENDURANCE AND DATA RETENTION

Parameter

Min.

Units

Endurance

100,000

Data Changes Per Bit

Store Cycles

1,000,000

Store Cycles

Data Retention

100

Years

3817 PGM T06

A.C. CONDITIONS OF TEST

Input Pulse Levels

0V to 3V

Input Rise and

Fall Times

10ns

Input and Output

Timing Levels

1.5V

3817 PGM T04.1

EQUIVALENT A.C. LOAD CIRCUIT

Notes: (3) Chip is deselected but may be automatically completing a store cycle.

(4)

STORE = LOW is required only to initiate the store cycle, after which the store cycle will be automatically completed

(e.g.

STORE = X).

parameters are periodically sampled and not 100% tested.

3815 FHD F09.1

919

Ω

497

Ω

OUTPUT

100pF

5V