Advanced Information

WM8181

WOLFSON MICROELECTRONICS LTD

AI Rev 3.0 January 2000

3

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

MIN

MAX

Digital supply voltage: DVDD

GND - 0.3V

GND + 7V

Analogue supply voltage: AVDD

GND - 0.3V

GND + 7V

Digital ground: DGND. Analogue ground: AGND1, AGND2

GND - 0.3V

GND + 0.3V

Digital inputs: MCLK, VSMP, CLAMP

GND - 0.3V

DVDD + 0.3V

Digital outputs: DOUT

GND - 0.3V

DVDD + 0.3V

Analogue inputs: VINM, VINP, VREFIN

GND - 0.3V

AVDD + 0.3V

Reference pins: VRT, VRB

GND - 0.3V

AVDD + 0.3V

0

Storage temperature

-65

+150

Package body temperature (soldering 10 seconds)

+240

Package body temperature (soldering 2 minutes)

+183

Notes: 1.

GND denotes the voltage of any ground pin.

2.

AGND and DGND pins are intended to be operated at the same potential. Differential voltages between these pins will

degrade performance.

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Operating temperature range

070

°C

Analogue supply voltage (5V)

AVDD

4.5

5.0

5.5

V

Analogue supply voltage (3.3V)

AVDD

2.97

3.3

3.63

V

Digital input and output

supply voltage

DVDD

2.97

3.3

AVDD

V