WM2626CD datasheet(3/11 Pages) WOLFSON

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Production Data

WM2626

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 April 2001

ELECTRICAL CHARACTERISTICS

Test Conditions:

RL = 10k

Ω, CL = 100pF. VDD = 5V ±10%, VREF = 2.048V and VDD = 3V ±10%, VREF = 1.024V over recommended operating free-

air temperature range (unless noted otherwise).

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Static DAC Specifications

Resolution

8bits

Integral non-linearity

INL

End point adjusted

See Note 1

±0.4

±1LSB

Differential non-linearity

DNL

See Note 2

±0.1

±0.5

LSB

Zero code error

ZCE

See Note 3

±24

Gain error

See Note 4

±0.6

% FSR

D.C. power supply rejection ratio

D.C. PSRR

See Note 5

Zero code error temperature coefficient

See Note 6

ppm/

°C

Gain error temperature coefficient

See Note 6

ppm/

°C

DAC Output Specifications

Output voltage range

VDD - 0.4

Output load regulation

Ω to 10kΩ load

See Note 7

0.25

% FS

Power Supplies

No load, DAC value = 128,

all digital inputs 0V or VDD

Fast

4.2

VDD=5V

Slow

3.6

Fast

3.7

6.3

Internal

Reference

VDD=3V

Slow

1.7

3.0

Fast

3.8

6.3

VDD=5V

Slow

1.7

3.0

Fast

3.4

5.7

Active supply current

External

Reference

VDD=3V

Slow

1.4

2.6

Power down supply current

IDD

µA

Dynamic DAC Specifications

Slew rate

RL = 10k

Ω, CL = 100pF

Slow

Fast

See Note 9

1.8

µs

Settling time

RL = 10k

Ω, CL = 100pF

Slow

Fast

See Note 10

2.8

0.8

5.5

2.4

µs

Glitch energy

DIN = 0 to 1, fCLK = 100kHz,

NCS = VDD

5nV-s

Signal to noise ratio

SNR

Signal to noise and distortion ratio

SINAD

Total harmonic distortion

THD

-50

-48

Spurious free dynamic range

SFDR

fs = 480kSPS,

fOUT = 1kHz,

RL = 10k

Ω, CL = 100pF

See Note 11

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