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APTGL475DA120D3G bảng dữ liệu(PDF) 2 Page - Microsemi Corporation |
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APTGL475DA120D3G bảng dữ liệu(HTML) 2 Page - Microsemi Corporation |
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2 / 5 page ![]() APTGL475DA120D3G www.microsemi.com 2- 5 All ratings @ Tj = 25°C unless otherwise specified Electrical Characteristics Symbol Characteristic Test Conditions Min Typ Max Unit ICES Zero Gate Voltage Collector Current VGE = 0V, VCE = 1200V 5 mA Tj = 25°C 1.8 2.2 VCE(sat) Collector Emitter saturation Voltage VGE = 15V IC = 400A Tj = 125°C 2.2 V VGE(th) Gate Threshold Voltage VGE = VCE , IC = 15mA 5.0 5.8 6.5 V IGES Gate – Emitter Leakage Current VGE = 20V, VCE = 0V 400 nA Dynamic Characteristics Symbol Characteristic Test Conditions Min Typ Max Unit Cies Input Capacitance 24.6 Coes Output Capacitance 1.62 Cres Reverse Transfer Capacitance VGE = 0V VCE = 25V f = 1MHz 1.38 nF QG Gate charge VGE= -8V / 15V ; VCE=600V IC=400A 2.3 µC Td(on) Turn-on Delay Time 200 Tr Rise Time 40 Td(off) Turn-off Delay Time 400 Tf Fall Time Inductive Switching (25°C) VGE = ±15V VCE = 600V IC = 400A RG = 1Ω 70 ns Td(on) Turn-on Delay Time 220 Tr Rise Time 50 Td(off) Turn-off Delay Time 500 Tf Fall Time Inductive Switching (150°C) VGE = ±15V VCE = 600V IC = 400A RG = 1Ω 80 ns Eon Turn-on Switching Energy TJ = 150°C 33 mJ Eoff Turn-off Switching Energy VGE = ±15V VCE = 600V IC = 400A RG = 1Ω TJ = 150°C 42 mJ Isc Short Circuit data VGE ≤15V ; VBus = 900V tp ≤10µs ; Tj = 150°C 1600 A Diode ratings and characteristics Symbol Characteristic Test Conditions Min Typ Max Unit VRRM Maximum Repetitive Reverse Voltage 1200 V Tj = 25°C 250 IRRM Maximum Reverse Leakage Current VR=1200V Tj = 150°C 2000 µA IF DC Forward Current TC = 80°C 400 A Tj = 25°C 1.7 2.2 VF Diode Forward Voltage IF = 400A VGE = 0V Tj = 150°C 1.65 V Tj = 25°C 155 trr Reverse Recovery Time Tj = 150°C 300 ns Tj = 25°C 37.2 Qrr Reverse Recovery Charge Tj = 150°C 78 µC Tj = 25°C 16 Err Reverse Recovery Energy IF = 400A VR = 600V di/dt = 7000A/µs Tj = 150°C 32 mJ |
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