TLP115

2002-09-25

4

Characteristic

Symbol

Test

Cir

-

cuit

Test Condition

Min.

Typ.

Max.

Unit

Propagation delay time

(H→L)

1

―

60

120

ns

Propagation delay time

(L→H)

1

―

60

120

ns

Output rise fall time

(10

-90%)

2

16mA

―

30

―

ns

Common mode transient

immunity at high output

level

2

1000

―

―

V / µs

Common mode transient

immunity at low output

level

2

-1000

―

―

V / µs

(Note 4) Device considered a two

-terminal device: Pins 1 and 3 shorted together, and pins 4, 5 and 6 shorted

together.

ceramic or solid tantalum capacitor with good high frequency characterstic and should be connected as

(Note 6) Maximum electrostatic discharge voltage for any pins: 180V(C=200pF, R=0)