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LSBKS9UG35162 bảng dữ liệu(PDF) 7 Page - LIGITEK electronics co., ltd.

tên linh kiện LSBKS9UG35162
Giải thích chi tiết về linh kiện  BIPOLAR TYPE LED LAMPS
PDF  7 Pages
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nhà sản xuất  LIGITEK [LIGITEK electronics co., ltd.]
Trang chủ  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LSBKS9UG35162 bảng dữ liệu(HTML) 7 Page - LIGITEK electronics co., ltd.

  LSBKS9UG35162 Datasheet HTML 1Page - LIGITEK electronics co., ltd. LSBKS9UG35162 Datasheet HTML 2Page - LIGITEK electronics co., ltd. LSBKS9UG35162 Datasheet HTML 3Page - LIGITEK electronics co., ltd. LSBKS9UG35162 Datasheet HTML 4Page - LIGITEK electronics co., ltd. LSBKS9UG35162 Datasheet HTML 5Page - LIGITEK electronics co., ltd. LSBKS9UG35162 Datasheet HTML 6Page - LIGITEK electronics co., ltd. LSBKS9UG35162 Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
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This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
This test intended to see soldering well
performed or not.
Solderability Test
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
The purpose of this test is the resistance
of the device under tropical for hours.
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Reliability Test:
High Temperature
High Humidity Test
Thermal Shock Test
Solder Resistance
Test
Low Temperature
Storage Test
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
Operating Life Test
High Temperature
Storage Test
Test Item
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Test Condition
Description
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-202:103B
JIS C 7021: B-11
JIS C 7021: B-12
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
MIL-STD-883:1008
JIS C 7021: B-10
Reference
Standard
Page 6/6
LSBKS9UG35162
PART NO.



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