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L9UG3333 bảng dữ liệu(PDF) 5 Page - LIGITEK electronics co., ltd.

tên linh kiện L9UG3333
Giải thích chi tiết về linh kiện  SUPER BRIGHT ROUND TYPE LED LAMPS
PDF  5 Pages
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nhà sản xuất  LIGITEK [LIGITEK electronics co., ltd.]
Trang chủ  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

L9UG3333 bảng dữ liệu(HTML) 5 Page - LIGITEK electronics co., ltd.

  L9UG3333 Datasheet HTML 1Page - LIGITEK electronics co., ltd. L9UG3333 Datasheet HTML 2Page - LIGITEK electronics co., ltd. L9UG3333 Datasheet HTML 3Page - LIGITEK electronics co., ltd. L9UG3333 Datasheet HTML 4Page - LIGITEK electronics co., ltd. L9UG3333 Datasheet HTML 5Page - LIGITEK electronics co., ltd.  
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MIL-STD-202:103B
JIS C 7021: B-11
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
Solderability Test
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
This test intended to see soldering well
performed or not.
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
Solder Resistance
Test
Thermal Shock Test
High Temperature
High Humidity Test
1.Ta=65
℃±5℃
2.RH=90 %~95 %
3.t=240hrs
±2hrs
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
The purpose of this test is the resistance
of the device under tropical for hous.
PART NO. L9UG3333
Reliability Test:
Page 4/4
Reference
Standard
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
JIS C 7021: B-12
MIL-STD-883:1008
JIS C 7021: B-10
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resisance of a part
in electrical and themal stressed.
Low Temperature
Storage Test
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
High Temperature
Storage Test
Operating Life Test
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of
the device which is laid under ondition
of hogh temperature for hours.
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
Test Item
Test Condition
Description
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only



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