IN-0

IN-1

IN-62

+

-

X 1

Differential

Output

Driver

CDS-0

Sh-r

Sh-s

Sig

-

Rst

AFE0064

OUTP_0

OUTM_0

IN

<00>

IN

<01>

IN

<62>

CDS-1

Sh-r

Sh-s

CDS-62

Sh-r

Sh-s

IN-63

IN

<63>

CDS-63

Sh-r

Sh-s

EXT_C

+

-

X 1

Differential

Output

Driver

Sig

-

Rst

REF GEN

TIMINGS AND CONTROL

PREF

P_REF

OUTP_1

OUTM_1

o/p

control

SMT_MD

ENTRI

STO, EOC

INTG, IRST, SHS, SHR, CLK, PDZ,

NAPZ, ENTRI, STI, PGA 0-2, INTUPZ

CHARGE INJECTION

DF_SM,

VT-A,

VT-B

To

integrators

VDD

VSS

AFE0064

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FUNCTIONAL BLOCK DIAGRAM

2

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