© 2009 Microchip Technology Inc.

Preliminary

DS22131C-page 3

25LCXXX

1.0

ELECTRICAL CHARACTERISTICS

Storage temperature ................................................................................................................................. -65°C to 155°C

ESD protection on all pins.......................................................................................................................................... 4 kV

TABLE 1-1:

DC CHARACTERISTICS

Note 1: AEC-Q100 reliability testing for devices intended to operate at 150°C is 1,000 hours. Any design in which

the total operating time between 125°C and 150°C will be greater than 1,000 hours is not warranted with-

out prior written approval from Microchip Technology Inc.

† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the

device. This is a stress rating only and functional operation of the device at those or any other conditions above those

indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an

extended period of time may affect device reliability.

DC CHARACTERISTICS

Extended (H):

Param.

No.

Sym.

Characteristic

Min.

Max.

Units

Test Conditions

D001

High-level input

voltage

V

D002

Low-level input

voltage

-0.3

≥ 2.7V

D003

-0.3

D004

Low-level output

voltage

—0.4

V

D005

—0.2

V

D006

High-level output

voltage

—

V

μA

D007

Input leakage current

—

±2

D008

Output leakage

current

—±2

D009

Internal Capacitance

(all inputs and

outputs)

—7

pF

D010

Operating Current

—

—

5

2.5

mA

mA

SO = Open

SO = Open

D011

—

—

5

3

mA

mA

D012

Standby Current

—

10

Note:

This parameter is periodically sampled and not 100% tested.