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AS29F040

AustinSemiconductor,Inc.reservestherighttochangeproductsorspecificationswithoutnotice.

15

AS29F040

Rev. 2.2 09/07

Austin Semiconductor, Inc.

TABLE 6: TEST CONDITIONS,

Test Specifications

AC CHARACTERISTICS: Read-Only Operations

FIGURE 7: TEST CONDITIONS,

Test Setup

NOTES:

1. See Figure 7 and Table 6 for test specifications.

2. Output driver disable time.

3. Not 100% tested.

CONDITIONS

-55

ALL OTHERS

UNIT

Output Load

(including jig capacitance)

30

100

pF

Input Rise and Fall Times

5

20

ns

Input Pulse Levels

0.0 - 3.0

0.45 - 2.4

V

Input timing measurement

reference levels

1.5

0.8, 2.0

V

Output timing measurement

reference levels

1.5

0.8, 2.0

V

1 TTL Gate

JEDEC

Std

-55

-70

90

-120

-150

Read Cycle Time

3

MIN

55

70

90

120

150

ns

Address to Output Delay

MAX

55

70

90

120

150

ns

Chip Enable to Output Delay

MAX

55

70

90

120

150

ns

Output Enable to Output Delay

MAX

30

30

35

50

55

ns

Chip Enable to Output High Z

2, 3

MAX

18

20

20

30

35

ns

Output Enable to Output High Z

2, 3

18

20

20

30

35

ns

Read

MIN

00000

ns

Toggle and

Data Polling

MIN

1010101010

ns

Output Hold Time From Addresses

CE\ or OE\, Whichever Occurs First

MIN

00000

ns

SPEED OPTIONS

1

UNITS

PARAMETER

TEST SETUP

Output Enable Hold Time

3

SYMBOL