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SN74ALS992 bảng dữ liệu(PDF) 2 Page - Texas Instruments

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tên linh kiện SN74ALS992
Giải thích chi tiết về linh kiện  9-BIT D-TYPE TRANSPARENT READ-BACK LATCH WITH 3-STATE OUTPUTS
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SN74ALS992 bảng dữ liệu(HTML) 2 Page - Texas Instruments

  SN74ALS992 Datasheet HTML 1Page - Texas Instruments SN74ALS992 Datasheet HTML 2Page - Texas Instruments SN74ALS992 Datasheet HTML 3Page - Texas Instruments SN74ALS992 Datasheet HTML 4Page - Texas Instruments SN74ALS992 Datasheet HTML 5Page - Texas Instruments SN74ALS992 Datasheet HTML 6Page - Texas Instruments  
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SN74ALS992
9-BIT D-TYPE TRANSPARENT READ-BACK LATCH
WITH 3-STATE OUTPUTS
SDAS028B – APRIL 1984 – REVISED JANUARY 1995
2
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
logic diagram (positive logic)
1D
C1
To Eight Other Channels
1
13
2
23
OERB
LE
1D
1Q
14
OEQ
11
CLR
R
timing diagram
Data Bus
LE
OERB
Q
tsu
th
tpd
tdis
Input Data
Read Back
Input Data
tpd
tsu†
CLR = H, OEQ = L
† This setup time ensures that the read-back circuit will not create a conflict on the input data bus.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡
Supply voltage, VCC
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage, VI (OERB, OEQ, CLR, and LE)
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage applied to D inputs and to disabled 3-state outputs
5.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA
0
°C to 70°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
– 65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.



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