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ST7LITE1XB bảng dữ liệu(PDF) 113 Page - STMicroelectronics

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Giải thích chi tiết về linh kiện  8-BIT MCU WITH SINGLE VOLTAGE FLASH MEMORY, DATA EEPROM, ADC, 5 TIMERS, SPI
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13.3.3 Operating Conditions with Low Voltage Detector (LVD)
13.3.3.1 Operating Conditions with LVD at TA = -40 to 125°C, unless otherwise specified
Notes:
1. The VDD rise time rate condition is needed to insure a correct device power-on and LVD reset. Not tested in production.
2. Use of LVD with capacitive power supply: with this type of power supply, if power cuts occur in the application, it is rec-
ommended to pull VDD down to 0V to ensure optimum restart conditions. Refer to circuit example in Figure 106 on
page 136 and note 4.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIT+(LVD)
Reset release threshold
(VDD rise)
High Threshold
Med. Threshold
Low Threshold
3.80
3.20
2.65
4.20
3.55
2.85
4.60
3.90
3.10
V
VIT-(LVD)
Reset generation threshold
(VDD fall)
High Threshold
Med. Threshold
Low Threshold
3.70
3.10
2.50
4.00
3.35
2.70
4.35
3.70
2.90
Vhys
LVD voltage threshold hysteresis
VIT+(LVD)-VIT-(LVD)
200
mV
VtPOR
VDD rise time rate
1)2)
100
ms/V
tg(VDD)
Filtered glitch delay on VDD
1)
Not detected by the LVD
150
ns
IDD(LVD)
LVD/AVD current consumption
200
µA



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