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QST108 bảng dữ liệu(PDF) 32 Page - STMicroelectronics

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Electrical characteristics
QST108
32/51
6.3
EMC characteristics
Susceptibility tests are performed on a sample basis during product characterization.
6.3.1
Functional EMS (electro magnetic susceptibility)
The product is stressed by two electro magnetic events until a failure occurs:
●
ESD: Electro-Static Discharge (positive and negative) is applied on all pins of the
device until a functional disturbance occurs. This test conforms with the IEC 1000-4-2
standard.
●
FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and
VSS through a 100pF capacitor, until a functional disturbance occurs. This test
conforms with the IEC 1000-4-4 standard.
A device reset allows normal operations to be resumed. The test results are given in the
table below based on the EMS levels and classes defined in application note AN1709.
6.3.2
Electro magnetic interference (EMI)
The product is monitored in terms of emission. This emission test is in line with the norm
SAE J 1752/3 which specifies the board and the loading of each pin.
Table 23.
Functional EMS
Symbol
Parameter
Conditions
Level/
Class
VFESD
Voltage limits to be applied on any I/O
pin to induce a functional disturbance
VDD=5V, TA=+25°C,
complies with IEC 1000-4-2
3B
VFFTB
Fast transient voltage burst limits to be
applied through 100pF on VDD and VDD
pins to induce a functional disturbance
VDD=5V, TA=+25°C
complies with IEC 1000-4-4
4A
Table 24.
EM emissions
Symbol
Parameter
Conditions
Monitored
Frequency Band
fDEVICE = 4 MHz
(1)
1.
Data based on characterization results, not tested in production.
Unit
SEMI
Peak level
VDD=5V, TA=+25°C,
complies with SAE J
1752/3
0.1 MHz to 30 MHz
20
dB
μV
30 MHz to 130 MHz
20
130 MHz to 1 GHz
13
SAE EMI Level
2.5
-



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