74LVC2G66

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© NXP Semiconductors N.V. 2016. All rights reserved.

Product data sheet

Rev. 9 — 15 December 2016

12 of 26

NXP Semiconductors

74LVC2G66

Bilateral switch

Test data is given in Table 11.

Definitions for test circuit:

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

VEXT = Test voltage for switching times.

Fig 19. Test circuit for measuring switching times

Table 11.

Test data

Supply voltage

Input

Load

VEXT

VCC

VI

tr, tf

CL

RL

tPLH, tPHL

tPZH, tPHZ

tPZL, tPLZ

1.65 V to 1.95 V

VCC

 2.0ns

30pF

1k



open

GND

2

 V

CC

2.3 V to 2.7 V

VCC

 2.0ns

30pF

500



open

GND

2

 V

CC

2.7 V

2.7 V

 2.5ns

50pF

500



open

GND

6 V

3.0 V to 3.6 V

2.7 V

 2.5ns

50pF

500



open

GND

6 V

4.5 V to 5.5 V

VCC

 2.5ns

50pF

500



open

GND

2

 V

CC