74HC_HCT03

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Product data sheet

Rev. 4 — 27 November 2015

7 of 14

NXP Semiconductors

74HC03; 74HCT03

Quad 2-input NAND gate; open-drain output

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Fig 7.

Test circuit for measuring switching times

Table 9.

Test data

Type

Input

Load

S1 position

VI

tr, tf

CL

RL

tPZL, tPLZ

74HC03

VCC

6ns

15pF, 50pF

1k



VCC

74HCT03

3.0 V

6 ns

15 pF, 50 pF

1 k



VCC