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SN54ALS874B bảng dữ liệu(PDF) 3 Page - Texas Instruments

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tên linh kiện SN54ALS874B
Giải thích chi tiết về linh kiện  DUAL 4-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOPS
PDF  20 Pages
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nhà sản xuất  TI [Texas Instruments]
Trang chủ  http://www.ti.com
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SN54ALS874B bảng dữ liệu(HTML) 3 Page - Texas Instruments

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SN54ALS874B, SN74ALS874B, SN74ALS876A
SN74AS874, SN74AS876
DUAL 4-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SDAS061C – APRIL 1982 – REVISED JANUARY 1995
3
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
logic diagrams (positive logic)
R
C1
1D
D1
Q1
R
C1
1D
D2
Q2
R
C1
1D
D3
Q3
R
C1
1D
D4
Q4
OE
CLK
CLR
SN54ALS874B, SN74ALS874B, SN74AS874
(each quad flip-flop)
S
C1
1D
D1
Q1
S
C1
1D
D2
Q2
S
C1
1D
D3
Q3
S
C1
1D
D4
Q4
OE
CLK
PRE
SN74ALS876A, SN74AS876
(each quad flip-flop)
Pin numbers shown are for the DW, JT, and NT packages.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage, VCC
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage, VI
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage applied to a disabled 3-state output
5.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: SN54ALS874B
– 55
°C to 125°C
. . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ALS874B, SN74ALS876A
0
°C to 70°C
. . . . . . . . . . . . . . . . .
Storage temperature range
– 65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.



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