FZ-S2MSLASHSC2M datasheet(6/54 Pages) OMRON

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AI Scratch Detect Filter

AI captures defects with human-like sensitivity

AI reproduces human expertise through learned criteria

Defect detection tasks that rely on human sensibility are a challenge to automate. Fortunately, powerful new AI technology

can match the skills and capabilities of experienced inspectors.

The latest capabilities of the FH Vision System include a new AI-based image filter that reproduces the technique

that skilled inspectors use to identify a defect on any product background. Scratches and blemishes that were

once difficult to capture can now be identified even without the use of samples or adjustment.

Automating human vision-based inspection with the FH Series

Cannot separate a scratch from noise

Previous detection image

Detection image

Can detect a scratch only

Captured image

*1. The FH-UMAI1 Scratch Detect AI Software Installer is required to use AI Scratch Detect Filter.

The AI Scratch Defect Filter learns by means of

images in which human inspectors noticed defects.

Whereas previous inspection methods found the

unexpected size, shape or color of a particular

defect to be a barrier to automation, AI successfully

extracts abnormalities by judging their features

without definition. The learned data facilitates

defect detection on processed surfaces and other

uneven backgrounds that previously posed an

insurmountable challenge.

Extracted scratch

(internal image)

Captured image

AI Scratch Detect Filter

FZ-S2M/SC2M bảng dữ liệu(PDF) 6 Page - Omron Electronics LLC