M58LW064 datasheet(29/53 Pages) STMICROELECTRONICS

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M58LW064A, M58LW064B

Table 23. Asynchronous Random Read

(TA = 0 to 70°C, –40 to 85°C, VDD = 2.7V to 3.6V, VDDQ = 1.8V to VDD)

Note: 1. Output Enable G may be delayed up to tELQV -tGLQV after the falling edge of Chip Enable E without increasing tELQV.

Symbol

Parameter

Test Condi tion

Min

Max

Unit

tAVAV

Address Valid to Address Valid

E=VIL,G = VIL

150

tAVQV

Addrss Valid to Output Valid

E=VIL,G = VIL

150

tAXQX

Address Transition to Output Transition

E=VIL,G = VIL

0ns

tEHLX

Chip Enable High to Latch Enable Transition

tEHQX

Chip Enable High to Output Transition

G = VIL

0ns

tEHQZ

Chip Enable High to Output Hi-Z

G= VIL

tELQV

(1)

Chip Enable Low to Output Valid

G= VIL

150

tELQX

Chip Enable Low to Output Transition

G= VIL

0ns

tGHQX

Output Enable High to Output Transition

E= VIL

0ns

tGHQZ

Output Enable High to Output Hi-Z

E= VIL

tGLQV

Output Enable Low to Output Valid

E = VIL

tGLQX

Output Enable to Output Transition

E= VIL

0ns

tLLEL

Latch Enable Low to Chip Enable Low

Figure 9. Asynchronous Random Read AC Waveforms

Asynchronous Read (M15 = 1), Random (M3 = 0)

AI03250

A1-A22

(1)

DQ0-DQx

(2)

VALID

tLLEL

tAXQX

tELQV

tELQX

tAVQV

tGLQX

tGLQV

tEHQZ

tEHQX

tEHLX

tGHQX

tGHQZ

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