M58BF008 datasheet(23/36 Pages) STMICROELECTRONICS

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M58BF008

Table 19. Synchronous Write AC Characteristics (1)

(TA = –40 to 125°C; VDD =5V ± 10% and VDDQ = 3.3V ± 0.3V)

Note: 1. See AC Testing Measurement conditions for timi ng measurements.

2. Sampled only, not 100% tested.

3. Time is measured to Status Register Read giving bit b7 = ’1’.

Symbol

Parameter

Min

Max

Unit

DCCLK

System Clock Duty Cycle

tAVCH

(2)

Address Valid to System Clock High

tBLCH

(2)

Load Burst Address Low to System Clock High

tCHAX

(2)

System Clock High to Address Transition

tCHBH

(2)

System Clock High to Load Burst Address High

tCHCL

System Clock Fall Time

tCHQV1

(3)

System Clock High to Output Valid, Program

µs

tCHQV2

(3)

System Clock High to Output Valid, Erase

2.1

sec

tCHQX

(2)

System Clock High to Data Transition

tCHWH

(2)

System Clock High to Write/Read High

tCHWRH

(2)

System Clock High to Write Enable High

tCLCH

System Clock Rise Time

tCLCL

System Clock Period

tELCH

Chip Enable Low to System Clock High

tPHCH

Reset/Power-down High to System Clock High

200

tQVCH

(2)

Data Valid to System Clock High

tQVVPL

(2)

Output Valid to VPP out of range VPP1 or VPPH

0ns

tVPHCH

(2)

VPP High to System Clock High

200

tWLCH

(2)

Write Enable Low to System Clock High

tWRLCH

(2)

Write/Read Low to System Clock High

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