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AP150P03NF bảng dữ liệu(PDF) 2 Page - A POWER MICROELECTRONICS |
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AP150P03NF bảng dữ liệu(HTML) 2 Page - A POWER MICROELECTRONICS |
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2 / 7 page ![]() AP150P03NF -30V P-Channel Enhancement Mode MOSFET AP150P03NF RVE1.0 永源微電子科技有限公司 Electrical Characteristics (TJ=25 ℃, unless otherwise noted) Symbol Parameter Conditions Min Typ Max Unit BVDSS Drain-Source Breakdown Voltage VGS=0V ID=-250μA -30 -35 V IDSS Zero Gate Voltage Drain Current VDS=-30V, VGS=0V -1 μA IGSS Gate-Body Leakage Current VGS=±20V, VDS=0V ±100 nA VGS(th) Gate Threshold Voltage VDS=VGS, ID=-250μA -1 -1.7 -2.5 V RDS(ON) Drain-Source On-State Resistance VGS=-10V, ID=-20A 2.5 3.2 mΩ VGS=-4.5V, ID=-20A 4.0 5.2 mΩ gFS Forward Transconductance VDS=-5V, ID=-20A 65 S Ciss Input Capacitance VDS=-15V, VGS=0V, f=1.0MHz 7000 pF Coss Output Capacitance 820 pF Crss Reverse Transfer Capacitance 540 pF Rg Gate resistance VGS=0V, VDS=0V, f=1.0MHz 2.2 Ω td(on) Turn-on Delay Time VGS=-10V, VDS=-15V, RL=0.75Ω, RGEN=3Ω 14 nS tr Turn-on Rise Time 13 nS td(off) Turn-Off Delay Time 65 nS tf Turn-Off Fall Time 37 nS Qg Total Gate Charge VGS=-10V, VDS=-15V, ID=-20A 130 nC Qgs Gate-Source Charge 12 nC Qgd Gate-Drain Charge 31 nC ISD Source-Drain Current (Body Diode) -150 A VSD Forward on Voltage (Note 3) VGS=0V, IS=-20A -1.3 V trr Reverse Recovery Time IF=-20A, di/dt=100A/μs 30 ns Qrr Reverse Recovery Charge IF=-20A, di/dt=100A/μs 40 nC Note : 1 、The data tested by surface mounted on a 1 inch 2 FR-4 board with 2OZ copper. 2 、The data tested by pulsed , pulse width ≦ 300us , duty cycle ≦ 2% 3 、 The EAS data shows Max. rating . The test condition is TJ =25℃, VDD=-15V, VG=-10V, RG=25Ω, L=0.5mH, IAS=-30A 4 、The power dissipation is limited by 150℃ junction temperature 5 、The data is theoretically the same as I D and I DM , in real applications , should be limited by total power dissipation. |
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