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AP80N10F bảng dữ liệu(PDF) 2 Page - A POWER MICROELECTRONICS |
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AP80N10F bảng dữ liệu(HTML) 2 Page - A POWER MICROELECTRONICS |
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2 / 7 page ![]() AP80N10F 100V N-Channel Enhancement Mode MOSFET AP80N10F REV1.1 永源微电子科技有限公司 Electrical Characteristics (TC=25℃unless otherwise noted) Symbol Parameter Conditions Min. Typ. Max. Unit V(BR)DSS Drain-Source Breakdown Voltage ID = 250uA, VGS = 0V 100 V IDSS Zero Gate Voltage Drain Current VDS=100V, VGS = 0V 1.0 uA IGSS Gate-Body Leakage Current VDS=0V, VGS=±20V ±100 nA VGS(th) Gate Threshold Voltage VDS=VGS, ID=250uA 2 3 4 V RDS(ON) Static Drain-Source ON-Resistance VGS=10V, ID=20A 8.5 12 mΩ gFS Forward Transconductance VDS=5V, ID=20A 48 S Ciss Input Capacitance VGS=0V, VDS=50V, f=1MHz 1959 pF Coss Output Capacitance 731 pF Crss Reverse Transfer Capacitance 3.0 pF Rg Gate Resistance VGS=0V, VDS=0V, f=1MHz 2.0 Ω Qg Total Gate Charge (@ VGS = 10V) VGS=0 to 10V VDS=50V, ID=20A 36 nC Qg Total Gate Charge (@ VGS = 6.0V) 18.2 nC Qgs Gate Source Charge 7.8 nC Qgd Gate Drain Charge 8.8 nC tD(on) Turn-On DelayTime VGS=10V, VDS=50V RL=2.5Ω, RGEN=6Ω 10.7 ns tr Turn-On Rise Time 21 ns tD(off) Turn-Off DelayTime 31 ns tf Turn-Off Fall Time 10.7 ns trr Body Diode Reverse Recovery Time IF=20A, dIF/dt = 100A/us 40 ns Qrr Body Diode Reverse Recovery Charge IF=20A, dIF/dt = 100A/us 41 nC IS Diode Continuous Current TC = 25°C 80 A VSD Diode Forward Voltage IS = 1A, VGS = 0V 0.7 1.2 V Notes: 1、The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper. 2、The data tested by pulsed , pulse width ≤ 300us , duty cycle ≤ 2% 3、The EAS data shows Max. rating . The test condition is VDD=80V, VGS=10V, L=0.1mH, IAS=17.5A 4、The power dissipation is limited by 150°C junction temperature 5、The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation. |
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