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TS881ICT bảng dữ liệu(PDF) 7 Page - STMicroelectronics |
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TS881ICT bảng dữ liệu(HTML) 7 Page - STMicroelectronics |
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7 / 21 page ![]() DocID023340 Rev 2 7/21 TS881 Electrical characteristics 21 Table 4. VCC =+1.2V, Tamb = +25 °C, VICM =VCC/2 (unless otherwise specified)(1) Symbol Parameter Test conditions Min. Typ. Max. Unit VIO Input offset voltage(2) -40 °C < Tamb < +125 °C -6 1 6 mV VIO Input offset voltage drift -40 °C < Tamb < +125 °C 3 µV/°C VHYST Input hysteresis voltage(3) -40 °C < Tamb < +125 °C 1.6 2.4 4.2 mV IIO Input offset current(4) -40 °C < Tamb < +125 °C -10 -100 10 100 pA IIB Input bias current(4) -40 °C < Tamb < +125 °C -10 -100 110 100 pA ICC Supply current per operator No load, output low, VID = -0.1 V -40 °C < Tamb < +85 °C -40 °C < Tamb < +125 °C No load, output high, VID = +0.1 V -40 °C < Tamb < +85 °C -40 °C < Tamb < +125 °C 300 210 450 500 1050 350 400 950 nA ISC Short-circuit current Source Sink 1.4 1.0 mA VOH Output voltage high Isource =0.2 mA -40 °C < Tamb < +85 °C -40 °C < Tamb < +125 °C 1.13 1.10 1.00 1.15 V VOL Output voltage low Isink =0.2 mA -40 °C < Tamb < +85 °C -40 °C < Tamb < +125 °C 40 50 60 70 mV CMRR Common mode rejection ratio 0 < VICM < VCC -40 °C < Tamb < +125 °C 50 68 dB TPLH Propagation delay (low to high) f=1kHz,CL =30 pF, RL =1M Overdrive = 10 mV -40 °C < Tamb < +125 °C Overdrive = 100 mV -40 °C < Tamb < +125 °C 6 2.2 11 13 3.1 3.4 µs TPHL Propagation delay (high to low) f=1kHz,CL =30 pF, RL =1M Overdrive = 10 mV -40 °C < Tamb < +125 °C Overdrive = 100 mV -40 °C < Tamb < +125 °C 5.1 2.0 8 10 2.6 3.1 µs TR Rise time (10% to 90%) CL =30pF, RL =1M 100 ns TF Fall time (90% to 10%) CL =30pF, RL =1M 110 ns TON Power-up time 1.0 1.5 ms 1. All values over the temperature range are guaranteed through correlation and simulation. No production test is performed at the temperature range limits. 2. The offset is defined as the average value of positive and negative trip points (input voltage differences requested to change the output state in each direction). 3. The hysteresis is a built-in feature of the TS881 device. It is defined as the voltage difference between the trip points. 4. Maximum values are guaranteed by design. |
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