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TS881 bảng dữ liệu(PDF) 6 Page - STMicroelectronics

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Electrical characteristics
TS881
6/21
DocID023340 Rev 2
2
Electrical characteristics
Table 3. VCC =+0.9V, Tamb = +25 °C, VICM = 0 V (unless otherwise specified)(1)
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
VIO
Input offset voltage (2)
-40 °C < Tamb < +85 °C
-10
-12
110
12
mV
VIO
Input offset voltage drift
-40 °C < Tamb < +85 °C
4.6
V/°C
VHYST Input hysteresis voltage(3)
-40 °C < Tamb < +85 °C
1.0
2.4
4.2
mV
IIO
Input offset current(4)
-40 °C < Tamb < +85 °C
-10
-100
10
100
pA
IIB
Input bias current(4)
-40 °C < Tamb < +85 °C
-10
-100
10
100
pA
ICC
Supply current per operator
No load, output low, VID =-0.1 V
-40 °C < Tamb < +85 °C
No load, output high, VID =+0.1 V
-40 °C < Tamb < +85 °C
300
260
400
450
350
400
nA
ISC
Short-circuit current
Source
Sink
0.2
0.4
mA
VOH
Output voltage high
Isource =50 A
-40 °C < Tamb < +85 °C
0.85
0.83
0.87
V
VOL
Output voltage low
Isink =50 A
-40 °C < Tamb < +85 °C
20
50
70
mV
TPLH
Propagation delay
(low to high)
f= 1kHz, CL =30pF, RL =1M
Overdrive = 10 mV
-40 °C < Tamb < +85 °C
Overdrive = 100 mV
-40 °C < Tamb < +85 °C
7.2
3.3
14
16
5.0
5.5
s
TPHL
Propagation delay
(high to low)
f= 1kHz, CL =30pF, RL =1M
Overdrive = 10 mV
-40 °C < Tamb < +85 °C
Overdrive = 100 mV
-40 °C < Tamb < +85 °C
6.0
2.5
11
12
4.5
5.0
s
TR
Rise time (10% to 90%)
CL =30pF, RL =1 M
160
ns
TF
Fall time (90% to 10%)
CL =30pF, RL =1 M
140
ns
TON
Power-up time
1.1
1.7
ms
1. All values over the temperature range are guaranteed through correlation and simulation. No production test is performed
at the temperature range limits.
2. The offset is defined as the average value of positive and negative trip points (input voltage differences requested to
change the output state in each direction).
3. The hysteresis is a built-in feature of the TS881 device. It is defined as the voltage difference between the trip points.
4. Maximum values are guaranteed by design.



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