L4964 datasheet(6/13 Pages) STMICROELECTRONICS

6 / 13 page

ELECTRICAL CHARACTERISTICS (continued)

(refer to the test circuits Tj =25

oC, Vi = 25V, unless otherwise specified)

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

Fig.

ERROR AMPLIFIER (continued)

I10

Input Bias Current

V10 = 5.2V, S1 : B

µA6c

DC Open Loop Gain

V9 = 1V to 3V, S1 : A, S2 : C

OSCILLATOR AND PWM COMPARATOR

–I7

Input Bias Current of

PWM Comparator

V7 = 0.5V to 3.5V

µA6a

–I11

Oscillator Source Current

V11 = 2V, S1 : A, S2 : B

–

RESET

V12R

Rising Threshold Voltage

Vi = 9 Vto36 V, S1 : B, S2 : B

Vref

- 150mV

Vref

- 100mV

Vref

- 50mV

V6d

V12F

Falling Threshold Voltage

4.75

Vref

- 150mV

Vref

- 100mV

V6d

V13D

Delay Threshold Voltage

V12 = 5.3 V, S1 : A, S2 : B

4.3

4.5

4.7

V13H

Delay Threshold Voltage

Hysteresis

100

V14S

Output Saturation Volt.

I14 = 5mA, V12 = 4.7V - S1, S2 : B

0.4

I12

Input Bias Current

V12 =0V to Vref, S1 : B, S2 : B

µA6d

–I13 so

I13 si

Delay Source Current

Delay Sink Current

V13 = 3V, S1 : A, S2 : B

V12 = 5.3V

V12 = 4.7V

110

150

µA

I14

Output Leakage Current

Vi = 36V, V12 = 5.3V, S1 : B, S2 : A

100

µA6d

C7, C8 : EKR (ROE)

L1 : L = 300

µHat 8 A

R= 500m

Ω

Core type : MAGNETICS 58930 - A2 MPP

° turns : 43

Wire Gauge : 1 mm (18 AWG)

Figure 4 : Dynamic Test Circuit

L4964

6/13

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