DDS39RF10ACL datasheet(7/175 Pages) TI2

7 / 175 page

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)

PARAMETER

TEST CONDITIONS

MIN

MAX

UNIT

Supply voltage range

Supply voltage range, VDDA18A, VDDA18B(2)

-0.3

2.45

Supply voltage range, VEEAM18, VEEBM18(2)

-2.0

0.3

Supply voltage range, VDDCLK18, VDDSYS18(3)

-0.3

2.45

Supply voltage range, VDDLB, VDDLA,

VDDCLK10(3)

-0.3

1.3

Supply voltage range, VDDIO, VQPS, VDDR18(4)

-0.3

2.45

Supply voltage range, VDDDIG, VDDEB, VDDEA,

VDDT(4)

-0.3

1.3

Voltage between any combination of

AGND, DGND and VSSCLK

Voltage between any combination of AGND,

DGND and VSSCLK

-0.1

0.1

Voltage applied to input pins

CLK+, CLK–, SYSREF+, SYSREF-(3)

-0.3

VDDCLK18+0.3

6SRX-/+, 14SRX-/+ AC Voltage

1.6

6SRX-/+, 14SRX-/+ DC Voltage to GND

-5

SCLK, SCS, SDI, RESET, SYNC, SCANEN,

TXEN[0:1], FRDI[0:3], FRCLK, FRCS, SYNC (4)

-0.3

VDDIO+0.3

EXTREF(2)

-0.3

VDDA18A + 0.3

Voltage at output pins

DACOUTA+, DACOUTA-(2)

-0.3

VDDA18A + 0.5

DACOUTB+, DACOUTB-(2)

-0.3

VDDA18B + 0.5

ATEST, RBIAS-/+(2)

-0.5

VDDA18B + 0.3

SDI, SDO, ALARM(4)

-0.5

VDDIO + 0.3

Peak input current (any input)

-20

Peak total input current (sum of absolute value of all currents forced in or out,

not including power supply current and DACOUTA+, DACOUTA–, DACOUTB+ and

DACOUTB–)

Junction temperature, TJ

150

°C

Storage temperature, Tstg

-65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress

ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under

Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device

reliability.

(2)

Measured to AGND.

(3)

Measured to VSSCLK.

(4)

Measured to DGND.

6.2 ESD Ratings

VALUE

UNIT

V(ESD)

Electrostatic discharge

Human body model (HBM), per ANSI/

ESDA/JEDEC JS-001, all pins(1)

1000

Charged device model (CDM), per ANSI/

ESDA/JEDEC JS-002, all pins(2)

250

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

www.ti.com

DDS39RF10, DDS39RFS10

SBASB20 – SEPTEMBER 2024

Submit Document Feedback

Product Folder Links: DDS39RF10 DDS39RFS10

DDS39RF10ACL bảng dữ liệu(PDF) 7 Page - Texas Instruments

DDS39RF10ACL bảng dữ liệu(HTML) 7 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 ...More

bảng dữ liệu tải về

Link URL