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STM32H533CE bảng dữ liệu(PDF) 123 Page - STMicroelectronics |
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STM32H533CE bảng dữ liệu(HTML) 123 Page - STMicroelectronics |
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123 / 231 page ![]() DS14539 Rev 1 123/231 STM32H533xx Electrical characteristics 200 64 MHz high-speed internal RC oscillator (HSI) ACCHSI48_REL(3) Accuracy of the HSI48 oscillator over temperature (reference is 30 °C) TJ = -40 to 130 °C -4.5 - 4 % ∆VDD(HSI48) HSI48 oscillator frequency drift with VDD (reference is 3.3 V) VDD = 3.0 to 3.6 V - 0.025 0.05 % VDD = 1.71 to 3.6 V - 0.05 0.1 tsu(HSI48)(3) HSI48 oscillator start-up time - - 2.1 4.0 μs IDD(HSI48)(3) HSI48 oscillator power consumption - - 350 400 μA NT jitter(3) Next transition jitter accumulated jitter on 28 cycles -- ±0.15 - ns PT jitter(3) Paired transition jitter accumulated jitter on 56 cycles(4) -- ±0.25 - 1. Calibrated during manufacturing tests. 2. Evaluated by characterization - Not tested in production. 3. Specified by design - Not tested in production. 4. Jitter measurements are performed without clock sources activated in parallel. Table 43. HSI48 oscillator characteristics (continued) Symbol Parameter Conditions Min Typ Max Unit Table 44. HSI oscillator characteristics(1) Symbol Parameter Conditions Min Typ Max Unit fHSI Frequency VDD = 3.3 V, TJ = 30 °C 63.7(2) 64.0(2) 64.3(2) MHz TRIM User trimming step Trimming is not a multiple of 32(3) - 0.24 0.32 % Trimming is 128, 256, and 384(3) -5.2 -1.8 - Trimming is 64, 192, 320, and 488(3) -1.4 -0.8 - Other trimmings are multiples of 32 (not including multiples of 64 and 128)(3) -0.6 -0.25 - DuCy(HSI) Duty cycle - 45 - 55 % ∆VDD(HSI) Frequency drift with VDD (reference is 3.3 V) VDD= 1.71 to 3.6 V -0.12 - 0.03 % ∆TEMP(HSI) Frequency drift over temperature (reference is 64 MHz) TJ= -20 to 105 °C -1(4) -1(4) TJ= -40 to 130 °C -2(4) -1(4) tsu(HSI) Start-up time - - 1.4 2.0 μs tstab(HSI) Stabilization time At 1% of target frequency - 4 8 μs At 1% of target frequency - - 4 IDD(HSI) Power consumption - - 300 450 μA 1. Specified by design - Not tested in production, unless otherwise specified. 2. Calibrated during manufacturing tests. 3. Trimming value of HSICAL[8:0.] 4. Guaranteed by characterization - Not tested n production. |
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