HCF4031 datasheet(5/12 Pages) STMICROELECTRONICS

5 / 12 page

DYNAMIC ELECTRICAL CHARACTERISTICS (T amb =25°C, CL = 50pF, RL = 200kΩ,

typical temperature coefficient for all VDD values is 0.3%/°C, all input rise and fall times = 20ns)

Test Conditions

Val ue

Symbol

Parameter

V DD (V) Min.

Typ.

Max.

Unit

t PHL ,

t PL H,tPLH

Propagation Delay Time :

Clock to Q,

Clock to Q

250

500

110

220

180

t PHL ,

t PL H,tPHL

Propagation Delay Time :

Clock to Q’

Clock to Q

190

380

160

130

Clock to CLD

100

200

100

t THL’,tTLH Transition Time :

(any output, except QtTHL)

100

200

100

t THL

100

t set u p

Data Setup Time

t ho ld

Data Hold Time

t W

Clock Pulse Width

120

240

100

f max

Maximum Clock Input

Frequency**

MHz

t r,tf

Clock Input Rise or Fall Time*

1000

µs

1000

200

If more than one unit is cascaded in the parallel clocked application, trCL should be made less than or equal to the sum of

the propagation delay at 50pF and the transmiti on time of the output driving stage.

* Maximum Clock Frequency for Cascaded Units;

a) Using Delayed Clock Feature in Recirculation Mode :

fmax =

(n-1) CLD prop. delay + Q prop. delay + set-up time

where n = nimber of packages

b) Not Usng Delaye Clock :

fmax =

propagation delay + set-up time

HCC/HCF4031B

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