VIH

VIL

tTRANSITION

10%

90%

OUTPUT

0 V

ADDRE SS

DRIVE

(VSEL)

VDD

tTRANSITION

VS

OUT PUT

RL

CL

A0

A1

A2

S1

S2

D

GND

VSEL

0 V

tr < 5ns

tf < 5ns

S8

VDD

VDD

0.1…F

VDD

VDD

S1

S2

GND

VS

S8

D

VD

ID (ON)

VDD

VDD

S1

S2

GND

VS

S8

D

Vs

A

IS (ON)

N.C.

N.C.

A

16

TMUX1208, TMUX1209

SCDS389C – AUGUST 2018 – REVISED DECEMBER 2018

www.ti.com

Product Folder Links: TMUX1208 TMUX1209

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Copyright © 2018, Texas Instruments Incorporated

Overview (continued)

8.1.3 On-Leakage Current

Source on-leakage current is defined as the leakage current flowing into or out of the source pin when the switch

is on. This current is denoted by the symbol IS(ON).

Drain on-leakage current is defined as the leakage current flowing into or out of the drain pin when the switch is

on. This current is denoted by the symbol ID(ON).

Either the source pin or drain pin is left floating during the measurement. Figure 9 shows the circuit used for

measuring the on-leakage current, denoted by IS(ON) or ID(ON).

Figure 9. On-Leakage Measurement Setup

8.1.4 Transition Time

Transition time is defined as the time taken by the output of the device to rise or fall 10% after the address signal

has risen or fallen past the logic threshold. The 10% transition measurement is utilized to provide the timing of

the device, system level timing can then account for the time constant added from the load resistance and load

capacitance. Figure 10 shows the setup used to measure transition time, denoted by the symbol tTRANSITION.

Figure 10. Transition-Time Measurement Setup