SN74AC00-Q1 Automotive Quadruple 2-Input NAND Gates

1 Features

• AEC-Q100 qualified for automotive applications:

– Device temperature grade 1: -40°C to +125°C

– Device HBM ESD classification level 2

– Device CDM ESD classification level C4B

• Available in wettable flank QFN package

• Wide operating range of 1.5V to 6V

• Inputs accept voltages up to 6V

• Continuous ±24mA output drive at 5V

• Supports up to ±75mA output drive at 5V

in short bursts

• Drives 50Ω transmission lines

• Maximum tpd of 8.5ns at 5V, 50pF load

2 Applications

• Alarm or tamper detect circuit

• S-R latch

3 Description

The SN74AC00-Q1 contains four independent 2-

input NAND gates. Each gate performs the Boolean

function of Y = A•B.

Device Information

PART NUMBER

PACKAGE(1)

PACKAGE SIZE(2)

BODY SIZE(3)

SN74AC00-Q1

BQA (WQFN, 14)

3mm x 2.5mm

3mm x 2.5mm

PW (TSSOP, 14)

5mm x 6.4mm

5mm x 4.4mm

(1)

For more information, see Mechanical, Packaging, and

Orderable Information.

(2)

The package size (length × width) is a nominal value and

includes pins, where applicable.

(3)

The body size (length × width) is a nominal value and does

not include pins.

xA

xB

xY

Logic diagram

SN74AC00-Q1

SCASE92A – MARCH 2025 – REVISED MARCH 2025

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.