ADS8028

SBAS549B – MAY 2011 – REVISED MARCH 2012

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERING INFORMATION

PACKAGE

PRODUCT

PACKAGE-LEAD

DESIGNATOR

PACKAGE MARKING

TRANSPORT MEDIA

Tape and Reel

ADS8028

QFN-20

RTJ

ADS8028IRTJ

Tape and Reel

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

VALUE

UNIT

AVDD to DGND, AGND

–0.3 to +7

V

DVDD to DGND, AGND

–0.3 to AVDD + 0.3

V

DGND to AGND

–0.3 to +0.3

V

Analog input (AIN0 to AIN7) to AGND

–0.3 to AVDD + 0.3

V

Digital input (CS, DIN, SCLK, PD/RST) to DGND

–0.3 to DVDD + 0.3

V

Digital output (DOUT, TM_BUSY) to DGND

–0.3 to DVDD + 0.3

V

REF to AGND

AVDD + 0.3

V

Input current to any pin (except supply), continuous

±10

mA

Operating temperature range

–40 to +125

°C

Storage temperature range

–65 to +150

°C

Maximum junction temperature

+150

°C

Human body model (HBM)

±2000

V

Electrostatic discharge

(ESD) ratings:

Charge device model (CDM)

±500

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

2

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