SN74HCS03-Q1 Automotive Quadruple 2-Input NAND Gates with Open-Drain Outputs

and Schmitt-Trigger Inputs

1 Features

• AEC-Q100 Qualified for automotive applications:

– Device temperature grade 1: –40°C to +125°C,

TA

– Device HBM ESD Classification Level 2

– Device CDM ESD Classifcation Level C6

• Wide operating voltage range: 2 V to 6 V

• Schmitt-trigger inputs allow for slow or noisy input

signals

• Low power consumption

– Typical ICC of 100 nA

– Typical input leakage current of ±100 nA

• ±7.8-mA output drive at 5 V

2 Applications

• Combine power good signals

• Combine enable signals

3 Description

This device contains four independent 2-input NAND

gates with open-drain outputs and Schmitt-trigger

inputs. Each gate performs the Boolean function Y =

A ● B in positive logic.

Device Information (1)

PART NUMBER

PACKAGE

BODY SIZE (NOM)

SN74HCS03QDRQ1

SOIC (14)

8.70 mm × 3.90 mm

SN74HCS03QPWRQ1 TSSOP (14)

5.00 mm × 4.40 mm

(1)

For all available packages, see the orderable addendum at

the end of the data sheet.

Input Voltage

Schmitt-trigger

CMOS Input

Response

Waveforms

Standard

CMOS Input

Response

Waveforms

Input Voltage

Input Voltage

Time

Time

Input Voltage

Waveforms

Low Power

Noise Rejection

Supports Slow Inputs

Time

Time

Time

Time

Benefits of Schmitt-Trigger Inputs

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SN74HCS03-Q1

SCLS759A – APRIL 2020 – REVISED OCTOBER 2020

Copyright © 2020 Texas Instruments Incorporated

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Product Folder Links: SN74HCS03-Q1

SN74HCS03-Q1

SCLS759A – APRIL 2020 – REVISED OCTOBER 2020

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.