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MAX3222CPWR bảng dữ liệu(PDF) 5 Page - Texas Instruments |
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MAX3222CPWR bảng dữ liệu(HTML) 5 Page - Texas Instruments |
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5 / 29 page ![]() 5 MAX3222 www.ti.com SLLS408H – JANUARY 2000 – REVISED OCTOBER 2016 Product Folder Links: MAX3222 Submit Documentation Feedback Copyright © 2000–2016, Texas Instruments Incorporated (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. (2) Maximum power dissipation is a function of TJ(max), θJA, and TA. The maximum allowable power dissipation at any allowable ambient temperature is PD = (TJ(max) − TA)/θJA. Operating at the absolute maximum TJ of 150°C can affect reliability. (3) The package thermal impedance is calculated in accordance with JESD 51-7. 6.4 Thermal Information THERMAL METRIC(1)(2)(3) MAX3222 UNIT DB (SSOP) DW (SOIC) PW (TSSOP) 20 PINS 20 PINS 20 PINS RθJA Junction-to-ambient thermal resistance 84.4 70.2 94.3 °C/W RθJC(top) Junction-to-case (top) thermal resistance 44.1 36.2 29.9 °C/W RθJB Junction-to-board thermal resistance 40 37.9 45.1 °C/W ψJT Junction-to-top characterization parameter 11 11.1 1.4 °C/W ψJB Junction-to-board characterization parameter 39.5 37.5 44.6 °C/W (1) Test conditions are C1 −C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2−C4 = 0.33 μF at VCC = 5 V ± 0.5 V. (2) All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C. 6.5 Electrical Characteristics: Device over operating free-air temperature range (unless otherwise noted) (1). See Figure 8. PARAMETER TEST CONDITIONS MIN TYP(2) MAX UNIT II Input leakage current (EN, PWRDOWN) ±0.01 ±1 µA ICC Supply current No load, PWRDOWN at VCC 0.3 1 mA Supply current (powered off) No load, PWRDOWN at GND 1 10 µA (1) Test conditions are C1 −C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2−C4 = 0.33 μF at VCC = 5 V ± 0.5 V. (2) All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C. 6.6 Electrical Characteristics: Driver over operating free-air temperature range (unless otherwise noted) (1). See Figure 8. PARAMETER TEST CONDITIONS MIN TYP(2) MAX UNIT VOH High-level output voltage DOUT at RL = 3 kΩ to GND, DIN = GND 5 5.4 V VOL Low-level output voltage DOUT at RL = 3 kΩ to GND, DIN = VCC –5 –5.4 V IIH High-level input current VI = VCC ±0.01 ±1 µA IIL Low-level input current VI at GND ±0.01 ±1 µA IOS Short-circuit output current VCC = 3.6 V, VO = 0 V ±35 ±60 mA VCC = 5.5 V, VO = 0 V ro Output resistance VCC, V+, and V– = 0 V, VO = ±2 V 300 10M Ω Ioff Output leakage current PWRDOWN = GND, VO = ±12 V, VCC = 3 V to 3.6 V ±25 µA PWRDOWN = GND, VO = ±10 V, VCC = 4.5 V to 5.5 V ±25 |
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