LMP7732

www.ti.com

SNOSAZ0E – AUGUST 2007 – REVISED MARCH 2013

2.5V Electrical Characteristics

(1)

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 2.5V, V− = 0V, V

CM = V

+/2, R

L >10 kΩ to V

+/2. Boldface

limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min(2)

Typ(3)

Max(2)

Units

±500

VCM = 2.0V

±9

±600

VOS

Input Offset Voltage(4)

μV

±500

VCM = 0.5V

±9

±600

VCM = 2.0V

±0.5

±5.5

TCVOS

Input Offset Voltage Temperature Drift

μV/°C

VCM = 0.5V

±0.2

±5.5

±30

VCM = 2.0V

±1

±45

IB

Input Bias Current

nA

±50

VCM = 0.5V

±12

±75

±50

VCM = 2.0V

±1

±75

IOS

Input Offset Current

nA

±60

VCM = 0.5V

±11

±80

TCIOS

Input Offset Current Drift

VCM = 0.5V and VCM = 2.0V

0.0474

nA/°C

0.15V

≤ VCM ≤ 0.7V

101

120

0.23V

≤ VCM ≤ 0.7V

89

CMRR

Common Mode Rejection Ratio

dB

1.5V

≤ VCM ≤ 2.35V

105

129

1.5V

≤ VCM ≤ 2.27V

99

105

113

2.5V

≤ V+ ≤ 5V

101

PSRR

Power Supply Rejection Ratio

dB

1.8V

≤ V+ ≤ 5.5V

111

CMVR

Common Mode Voltage Range

Large Signal CMRR

≥ 80 dB

0

2.5

V

RL = 10 kΩ to V

+/2

112

130

VOUT = 0.5V to 2.0V

104

AVOL

Open Loop Voltage Gain

dB

RL = 2 kΩ to V

+/2

109

119

VOUT = 0.5V to 2.0V

90

50

RL = 10 kΩ to V

+/2

4

75

Output Voltage Swing High

50

RL = 2 kΩ to V

+/2

13

75

mV from

VOUT

either rail

50

RL = 10 kΩ to V

+/2

6

75

Output Voltage Swing Low

50

RL = 2 kΩ to V

+/2

9

75

Sourcing, VOUT = V

+/2

22

31

VIN (diff) = 100 mV

12

IOUT

Output Current

mA

Sinking, VOUT = V

+/2

15

44

VIN (diff) = −100 mV

10

5.4

VCM = 2.0V

4.0

6.8

IS

Supply Current

mA

6.2

VCM = 0.5V

4.6

7.8

AV = +1, CL = 10 pF, RL = 10 kΩ to V

+/2

SR

Slew Rate

2.4

V/

μs

VOUT = 2 VPP

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA. Absolute maximum Ratings indicate junction temperature limits beyond

which the device maybe permanently degraded, either mechanically or electrically.

(2)

All limits are specified by testing, statistical analysis or design.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

Ambient production test is performed at 25°C with a variance of ±3°C.

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