ADL5375-05ACPZ-R71 datasheet(29/32 Pages) AD

29 / 32 page

ADL5375

Rev. 0 | Page 29 of 32

CHARACTERIZATION SETUP

F-MOD TEST SETUP

OUT

GND

VPOS

F-MOD

I OUT

Q OUT

VPOS +5V

OUTPUT

90°

0°

ROHDE & SCHWARTZ

SPECTRUM ANALYZER

FSU 20Hz TO 8GHz

I/AM

Q/FM

AGILENT 34401A

MULTIMETER

0.175 ADC

AGILENT E3631A

POWER SUPPLY

5.000

0.175A

COM

±25V

–

AEROFLEX

IFR 3416

250kHz TO 6GHz SIGNAL GENERATOR

OUT

FREQ 4MHz

LEVEL 0dBm

BIAS 0.5V

GAIN 0.7V

CONNECT TO BACK OF UNIT

+6dBm

Figure 74. Characterization Bench Setup

The primary setup used to characterize the ADL5375 is shown

in Figure 74. This setup was used to evaluate the product as a

single-sideband modulator. The Aeroflex signal generator supplied

the LO and differential I and Q baseband signals to the device

under test (DUT). The typical LO drive was 0 dBm. The I-channel

is driven by a sine wave, and the Q-channel is driven by a cosine

wave. The lower sideband is the single-sideband (SSB) output.

The majority of characterization for the ADL5375 was performed

using a 1 MHz sine wave signal with a 500 mV (ADL5375-05)

or 1500 mV (ADL5375-15) common-mode voltage applied to

the baseband signals of the DUT. The baseband signal path was

calibrated to ensure that the VIOS and VQOS offsets on the

baseband inputs were minimized as close as possible to 0 V

before connecting to the DUT. See the Carrier Feedthrough

Nulling section for the definitions of VIOS and VQOS.

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